| 1. Identity statement | |
| Reference Type | Journal Article |
| Site | mtc-m16.sid.inpe.br |
| Holder Code | isadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S |
| Identifier | 6qtX3pFwXQZsFDuKxG/CFkPm |
| Repository | sid.inpe.br/marciana/2004/07.06.11.13 |
| Last Update | 2004:07.06.03.00.00 (UTC) administrator |
| Metadata Repository | sid.inpe.br/marciana/2004/07.06.11.13.18 |
| Metadata Last Update | 2018:06.05.01.28.41 (UTC) administrator |
| Secondary Key | INPE-10803-PRE/6259 |
| ISBN/ISSN | 0021-8979 |
| ISSN | 0021-8979 |
| Citation Key | HolyKuAbLiPeKo:1993:XRDoTr |
| Title | X-Ray Double and Triple-Crystal Diffractometry of Mosaic Structure in Heteroepitaxial Layers  |
| Project | TECMAT: Tecnologia de materiais |
| Year | 1993 |
| Month | Aug. |
| Access Date | 2024, May 18 |
| Secondary Type | PRE PI |
| Number of Files | 1 |
| Size | 943 KiB |
| 2. Context | |
| Author | 1 Holy, V. 2 Kubena, J. 3 Abramof, Eduardo 4 Lischka, K. 5 Pesek, A. 6 Koppensteiner, E. |
| Resume Identifier | 1 2 3 8JMKD3MGP5W/3C9JGUH |
| Group | 1 2 3 LAS-INPE-MCT-BR |
| Affiliation | 1 Masaryk University, Faculty of Science, Department of Solid State Physics 2 Masaryk University, Faculty of Science, Department of Solid State Physics 3 Instituto Nacional de Pesquisas Espaciais, Laboratório Associado de Sensores e Materiais, (INPE. LAS) 4 Kepler University, Institute of Optoelectronics 5 Kepler University, Institute of Optoelectronics 6 Kepler University, Institute of Semiconductor Physics |
| Journal | Journal of Applied Physics |
| Volume | 74 |
| Number | 3 |
| Pages | 1736-1743 |
| History (UTC) | 2006-09-28 22:36:13 :: administrator -> sergio :: 2008-01-07 12:49:55 :: sergio -> marciana :: 2008-03-14 18:42:33 :: marciana -> administrator :: 2018-06-05 01:28:41 :: administrator -> marciana :: 1993 |
| 3. Content and structure | |
| Is the master or a copy? | is the master |
| Content Stage | completed |
| Transferable | 1 |
| Content Type | External Contribution |
| Keywords | SENSORS AND MATERIALS X-ray diffraction Diffraction Defects Silicon SENSORES E MATERIAIS Difração de raio-x Difração Defeitos Silicone |
| Abstract | X-ray diffraction in thin layers containing small randomly placed defects is described by means of the kinematical diffraction theory and optical coherence formalism. The method enables us to calculate both the diffracted intensity and its angular distribution, so that it can be used for simulating double crystal and triple crystal x-ray diffractometry experiments. The theory has been applied to experimental data obtained from diffractometry measurements of an epitaxial ZnTe layer with mosaic structure after several steps of chemical thinning. A good agreement of the theory with experiments has been achieved. |
| Area | FISMAT |
| Arrangement | urlib.net > BDMCI > Fonds > Produção anterior à 2021 > LABAS > X-Ray Double and... |
| doc Directory Content | access |
| source Directory Content | there are no files |
| agreement Directory Content | there are no files |
| 4. Conditions of access and use | |
| data URL | http://urlib.net/ibi/6qtX3pFwXQZsFDuKxG/CFkPm |
| zipped data URL | http://urlib.net/zip/6qtX3pFwXQZsFDuKxG/CFkPm |
| Language | en |
| Target File | JAP01736.pdf |
| User Group | administrator marciana sergio |
| Visibility | shown |
| Copy Holder | SID/SCD |
| Archiving Policy | allowpublisher allowfinaldraft |
| Read Permission | allow from all |
| 5. Allied materials | |
| Next Higher Units | 8JMKD3MGPCW/3ESR3H2 |
| Citing Item List | sid.inpe.br/mtc-m21/2012/07.13.14.44.57 1 |
| Dissemination | WEBSCI; PORTALCAPES; COMPENDEX. |
| Host Collection | sid.inpe.br/banon/2003/08.15.17.40 |
| 6. Notes | |
| Empty Fields | alternatejournal archivist callnumber copyright creatorhistory descriptionlevel documentstage doi e-mailaddress electronicmailaddress format isbn label lineage mark mirrorrepository nextedition notes orcid parameterlist parentrepositories previousedition previouslowerunit progress readergroup rightsholder schedulinginformation secondarydate secondarymark session shorttitle sponsor subject tertiarymark tertiarytype typeofwork url versiontype |
| 7. Description control | |
| e-Mail (login) | marciana |
| update | |